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			Surfaces / Interfaces Microscopy X11MA

General description and specifications

Energy range:	90-2000 eV
Flux (10 keV):	1 x 10¹⁵ ph/s/0.1%BW/0.4 A
Focused spot size:	30 µm x 100 µm (VxH)
Spectral resolution	>5000
Polarization	Linear (0 deg/horizontal to 90 deg/vertical) Circular (right/left)
End-station ES1	Photoemission electron microscope with spatial resolution=100 nm, variable sample temperature:120-1'800 K.
End-station ES3	XMCD chamber for TEY measurements in applied field (130 mT) and variable sample temperature (15-300 K). This small XMCD chamber is currently not available (2008). Instead, the TBT is as User endstation at the SIM beamline.
End-station ES4	Presently RESOXS, NNPEH. (These endstations belong to a user group and can only be used in collaboration with them)

The SIM beamline produces a high flux of soft X-rays from an undulator source. The beamline has one endstation open to user via the SLS proposals system:

PhotoEmission Electron Microscopy (PEEM)

The permanent endstation of the SIM beamline is a Photoemission Electron microscope (PEEM) (Model: LEEM III, Elmitec GmbH). It allows to image samples using the photoelectric effect with very high spatial resolution. With an additional energy analyzer these photoelectrons can be energy-selected. In addition to illumination by X-rays, illumination by low energy electrons is possible. In this low energy electron microscopy (LEEM) mode additional contrast mechanisms are available. The PEEM is equipped with a small preparation chamber (sputtering, heating, load-lock). In addition, a more complete preparation system is available with a load-lock, LEED and Auger, several evaporation sources, rotatable electromagnetic coil, ion etching and electron bombardment heating.

In addition, Users can apply for beamtime with their own endstation (after prior consulation with the beamline scientist).